The system will be going down for regular maintenance. Please save your work and logout.
Property testing for distributions on partially ordered sets
| dc.contributor.advisor | Ronitt Rubinfeld. | en_US |
| dc.contributor.author | Biswal, Punyashloka | en_US |
| dc.contributor.other | Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. | en_US |
| dc.date.accessioned | 2008-04-23T14:35:23Z | |
| dc.date.available | 2008-04-23T14:35:23Z | |
| dc.date.copyright | 2007 | en_US |
| dc.date.issued | 2007 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/41247 | |
| dc.description | Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2007. | en_US |
| dc.description | Includes bibliographical references (p. 24). | en_US |
| dc.description.abstract | We survey the results of Rubinfeld, Batu et al. ([2], [3]) on testing distributions for monotonicity, and testing distributions known to be monotone for uniformity. We extend some of their results to new partial orders, and provide evidence for some new conjectural lower bounds. Our results apply to various partial orders: bipartite graphs, lines,, trees, grids, and hypercubes. | en_US |
| dc.description.statementofresponsibility | by Punyashloka Biswal. | en_US |
| dc.format.extent | 24 p. | en_US |
| dc.language.iso | eng | en_US |
| dc.publisher | Massachusetts Institute of Technology | en_US |
| dc.rights | M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. | en_US |
| dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | en_US |
| dc.subject | Electrical Engineering and Computer Science. | en_US |
| dc.title | Property testing for distributions on partially ordered sets | en_US |
| dc.type | Thesis | en_US |
| dc.description.degree | M.Eng. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | |
| dc.identifier.oclc | 213331599 | en_US |
