| dc.contributor.advisor | Gill Pratt. | en_US |
| dc.contributor.author | Fleming, James Wiley | en_US |
| dc.date.accessioned | 2008-04-23T14:46:41Z | |
| dc.date.available | 2008-04-23T14:46:41Z | |
| dc.date.copyright | 1994 | en_US |
| dc.date.issued | 1994 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/41329 | |
| dc.description | Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1994. | en_US |
| dc.description | Includes bibliographical references (p. 93-94). | en_US |
| dc.description.statementofresponsibility | by James Wiley Fleming. | en_US |
| dc.format.extent | 94 p. | en_US |
| dc.language.iso | eng | en_US |
| dc.publisher | Massachusetts Institute of Technology | en_US |
| dc.rights | M.I.T. theses are protected by
copyright. They may be viewed from this source for any purpose, but
reproduction or distribution in any format is prohibited without written
permission. See provided URL for inquiries about permission. | en_US |
| dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | en_US |
| dc.subject | Electrical Engineering and Computer Science | en_US |
| dc.title | A real-time three dimensional profiling depth from focus method | en_US |
| dc.type | Thesis | en_US |
| dc.description.degree | M.S. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | |
| dc.identifier.oclc | 31312059 | en_US |
