Vertical profile engineering and reliability study of silicon-germanium heterojunction bipolar transistors

Author(s)
Liao, Kenneth S. (Kenneth Sen-Chun)
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Advisor
L. Rafael Reif.
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Description
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996.
 
Includes bibliographical references (leaves 133-141).
 
Date issued
1996
URI
http://hdl.handle.net/1721.1/41347
Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Publisher
Massachusetts Institute of Technology
Keywords
Electrical Engineering and Computer Science
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