Characterization of hot-carrier reliability in analog sub-circuit design
Author(s)
Le, Huy X. P![Thumbnail](/bitstream/handle/1721.1/41379/35334375-MIT.pdf.jpg?sequence=5&isAllowed=y)
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Advisor
James E. Chung.
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Show full item recordDescription
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996. Includes bibliographical references (leaves 52-54).
Date issued
1996Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer SciencePublisher
Massachusetts Institute of Technology
Keywords
Electrical Engineering and Computer Science