Characterization of hot-carrier reliability in analog sub-circuit design

Author(s)
Le, Huy X. P
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Advisor
James E. Chung.
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Description
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996.
 
Includes bibliographical references (leaves 52-54).
 
Date issued
1996
URI
http://hdl.handle.net/1721.1/41379
Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Publisher
Massachusetts Institute of Technology
Keywords
Electrical Engineering and Computer Science
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