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dc.contributor.advisorStuart E. Madnick.en_US
dc.contributor.authorAguirre, Juan Ignacioen_US
dc.contributor.otherSystem Design and Management Program.en_US
dc.date.accessioned2008-09-03T15:24:59Z
dc.date.available2008-09-03T15:24:59Z
dc.date.copyright2007en_US
dc.date.issued2007en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/42350
dc.descriptionThesis (S.M.)--Massachusetts Institute of Technology, System Design and Management Program, 2007.en_US
dc.descriptionIncludes bibliographical references.en_US
dc.description.abstractThis thesis evaluates the likelihood of EPCglobal becoming the universal RFID standard by presenting a framework of ten factors used to analyze and determine if EPCglobal is moving in the right direction. The ten factors are: complexity of application (Supply Chain Management), mandates, privacy policy, member type, EPCglobal standard development process, membership size, intellectual property policy, benefits, system cost, and China. These factors have been used in various analyses and studies that explain the main reasons for the adoption of other technologies and/or standards. Therefore, this thesis not only presents an analysis for the adoption of EPCglobal as the universal standard but also presents the factors that could help EPCglobal achieve its goal. The results show that five of the ten factors that influence the establishment of EPCglobal as the universal standard have a positive effect for the universal adoption of EPCglobal, two are neutral, and three are negative. Thus, there is a strong likelihood that EPCglobal could successfully become the universal standard for RFID system in the retail supply chain management. Furthermore, if EPCglobal strives to have the two neutral rated factors join the other five positive factors and makes an effort to switch the three negative factors to positive, then EPCglobal would be on the right path to becoming the universal standard.en_US
dc.description.statementofresponsibilityby Juan Ignacio Aguirre.en_US
dc.format.extent82 leavesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectSystem Design and Management Program.en_US
dc.titleEPCglobal : a universal standarden_US
dc.title.alternativeElectronic Product Code global : a universal standarden_US
dc.typeThesisen_US
dc.description.degreeS.M.en_US
dc.contributor.departmentSystem Design and Management Program.en_US
dc.identifier.oclc234176905en_US


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