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dc.contributor.advisorErnest G. Cravalho.en_US
dc.contributor.authorMalone, Christopher Gregory, 1967-en_US
dc.date.accessioned2008-11-07T20:12:00Z
dc.date.available2008-11-07T20:12:00Z
dc.date.copyright1997en_US
dc.date.issued1997en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/43559
dc.descriptionThesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 1997.en_US
dc.descriptionIncludes bibliographical references (leaves 195-203).en_US
dc.description.statementofresponsibilityby Christopher Gregory Malone.en_US
dc.format.extent203 leavesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectMechanical Engineeringen_US
dc.titleA technique for the measurement of the far-infrared radiative properties of metal and superconducting thin filmsen_US
dc.typeThesisen_US
dc.description.degreePh.D.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineering
dc.identifier.oclc38529420en_US


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