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dc.contributor.advisorSilvio Micali.en_US
dc.contributor.authorValiant, Paul (Paul Andrew)en_US
dc.contributor.otherMassachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2009-03-16T19:33:34Z
dc.date.available2009-03-16T19:33:34Z
dc.date.copyright2008en_US
dc.date.issued2008en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/44717
dc.descriptionThesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2008.en_US
dc.descriptionIncludes bibliographical references (p. 65-66).en_US
dc.description.abstractWe introduce the notion of a Canonical Tester for a class of properties on distributions, that is, a tester strong and general enough that "a distribution property in the class is testable if and only if the Canonical Tester tests it". We construct a Canonical Tester for the class of symmetric properties of one or two distributions, satisfying a certain weak continuity condition. Analyzing the performance of the Canonical Tester on specific properties resolves several open problems, establishing lower bounds that match known upper bounds: we show that distinguishing between entropy < a or > p on distributions over [n] requires nc/P-O(1) samples, and distinguishing whether a pair of distributions has statistical distance < a or > 0 requires n1-o(1) samples. Our techniques also resolve a conjecture about a property that our Canonical Tester does not apply to: distinguishing identical distributions from those with statistical distance > 0 requires Q(n2/3) samples.en_US
dc.description.statementofresponsibilityby Paul Valiant.en_US
dc.format.extent66 p.en_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectElectrical Engineering and Computer Science.en_US
dc.titleTesting symmetric properties of distributionsen_US
dc.typeThesisen_US
dc.description.degreePh.D.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.identifier.oclc297547243en_US


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