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dc.contributorSaito, Shigebumi.en_US
dc.date.accessioned2004-03-02T23:09:06Z
dc.date.available2004-03-02T23:09:06Z
dc.date.issued1957en_US
dc.identifier.other333en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/4486
dc.description"August 22, 1957. "en_US
dc.descriptionBibliography: p. 50.en_US
dc.description.sponsorshipArmy Signal Corps Contract DA36-039-sc-64637 Dept. of the Army Task 3-99-06-108 Project 3-99-00-100en_US
dc.description.statementofresponsibilityShigebumi Saito.en_US
dc.format.extent50 p.en_US
dc.format.extent2587557 bytes
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherResearch Laboratory of Electronics, Massachusetts Institute of Technologyen_US
dc.relation.ispartofseriesTechnical report (Massachusetts Institute of Technology. Research Laboratory of Electronics) ; 333.en_US
dc.subject.lccTK7855.M41 R43 no.333en_US
dc.subject.lcshElectron beamsen_US
dc.subject.lcshNoise Measurementen_US
dc.titleNew method of measuring the noise parameters of the electron beam, especially the correlation between its velocity and current fluctuationsen_US


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