dc.contributor.advisor | Kamal Youcef-Toumi. | en_US |
dc.contributor.author | SooHoo, Kimberly E | en_US |
dc.contributor.other | Massachusetts Institute of Technology. Dept. of Mechanical Engineering. | en_US |
dc.date.accessioned | 2009-04-29T17:25:12Z | |
dc.date.available | 2009-04-29T17:25:12Z | |
dc.date.copyright | 2008 | en_US |
dc.date.issued | 2008 | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.1/45319 | |
dc.description | Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2008. | en_US |
dc.description | Includes bibliographical references (p. 47). | en_US |
dc.description.abstract | High speed atomic force microscopy (AFM) is a developing process in which nanoscale objects, such as crystal structures or strands of DNA, can be imaged at rates fast enough to watch processes as they occur. Although current generation AFM is already pivotal in many fields of research and industry, slow scan rates inhibit the imaging of dynamic samples. Much advancement has been made in high speed AFM thus far, yet many subsystems remain to be developed. This thesis outlines the development of a feedback controller for the AFM scanner, as well as the filters designed to attenuate high frequency noise. A comparison of the scan signals and scanner output signals are compared, with and without the controller and filters. Post-data acquisition image processing techniques are also described and compared with raw data. Finally, these techniques are applied to the high speed imaging of calcite etched with hydrochloric acid. | en_US |
dc.description.statementofresponsibility | by Kimberly E. SooHoo. | en_US |
dc.format.extent | 47 p. | en_US |
dc.language.iso | eng | en_US |
dc.publisher | Massachusetts Institute of Technology | en_US |
dc.rights | M.I.T. theses are protected by
copyright. They may be viewed from this source for any purpose, but
reproduction or distribution in any format is prohibited without written
permission. See provided URL for inquiries about permission. | en_US |
dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | en_US |
dc.subject | Mechanical Engineering. | en_US |
dc.title | On advancement of high speed atomic force microscope technology | en_US |
dc.title.alternative | On the advancement of AFM | en_US |
dc.type | Thesis | en_US |
dc.description.degree | S.B. | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Mechanical Engineering | |
dc.identifier.oclc | 314404173 | en_US |