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dc.contributor.advisorVladan Vultić.en_US
dc.contributor.authorPruttivarasin, Thaneden_US
dc.contributor.otherMassachusetts Institute of Technology. Dept. of Physics.en_US
dc.date.accessioned2009-07-01T17:02:05Z
dc.date.available2009-07-01T17:02:05Z
dc.date.copyright2008en_US
dc.date.issued2008en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/45339
dc.descriptionThesis (S.B.)--Massachusetts Institute of Technology, Dept. of Physics, 2008.en_US
dc.descriptionThis electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections.en_US
dc.descriptionIncludes bibliographical references (p. 113-114).en_US
dc.description.abstractWe demonstrate a new isotope-selective system to measure low energy charge transfer collisions between ytterbium ions and atoms in the range of collisional energy from 2.2x 10-5 eV to 4.3x 10-3 eV, corresponding to effective temperature from 250 mK to 50 K. The charge transfer collisions are observed by spatially overlapping the 172yb+ ions in the surface-electrode trap and 174Yb atoms in the magneto-optical trap, and measuring ion loss. We confirm that, in the Langevin regime, the charge transfer collisional rate is independent of the collisional energy. The measured Langevin cross section is consistent with a theoretical value for the ytterbium atomic polarizability of 143 a.u., as calculated by Zhang and Dalgarno [1].en_US
dc.description.statementofresponsibilityby Thaned Pruttivarasin.en_US
dc.format.extent114 p.en_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectPhysics.en_US
dc.titleStudy of low energy Ytterbium atom-ion charge transfer collisions using a surface-electrode trapen_US
dc.typeThesisen_US
dc.description.degreeS.B.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Dept. of Physics.en_US
dc.identifier.oclc315907539en_US


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