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Enhanced methods for the design and test of CMOS process test vehicles

dc.contributor.advisorAnantha Chandrakasan.en_US
dc.contributor.authorEcheruo, Ugonna (Ugonna Chukwudalu), 1974-en_US
dc.date.accessioned2009-06-30T18:00:51Z
dc.date.available2009-06-30T18:00:51Z
dc.date.copyright1998en_US
dc.date.issued1998en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/46211
dc.descriptionThesis (S.B. and M.Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1998.en_US
dc.descriptionIncludes bibliographical references (p. 127).en_US
dc.description.statementofresponsibilityby Ugonna Echeruo.en_US
dc.format.extent127 p.en_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectElectrical Engineering and Computer Scienceen_US
dc.titleEnhanced methods for the design and test of CMOS process test vehiclesen_US
dc.title.alternativeAdvanced methods for design of CMOS process test vehiclesen_US
dc.typeThesisen_US
dc.description.degreeS.B.and M.Eng.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.identifier.oclc41461412en_US


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