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Procedure for optimal D.C. parameter extraction for hot-carrier degradation model calibration and verification

dc.contributor.advisorJames Chung.en_US
dc.contributor.authorDao, Steve Gia, 1973-en_US
dc.date.accessioned2009-10-01T15:10:58Z
dc.date.available2009-10-01T15:10:58Z
dc.date.copyright1998en_US
dc.date.issued1998en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/47435
dc.descriptionThesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1998.en_US
dc.descriptionIncludes bibliographical references (leaves 98-100).en_US
dc.description.statementofresponsibilityby Steve Gia Dao.en_US
dc.format.extent100 leavesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectElectrical Engineering and Computer Scienceen_US
dc.titleProcedure for optimal D.C. parameter extraction for hot-carrier degradation model calibration and verificationen_US
dc.typeThesisen_US
dc.description.degreeM.S.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.identifier.oclc39134657en_US


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