Hot-carrier reliability assessment in CMOS digital integrated circuits
Author(s)
Jiang, Wenjie, 1963-![Thumbnail](/bitstream/handle/1721.1/47514/40336257-MIT.pdf.jpg?sequence=5&isAllowed=y)
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Advisor
James E. Chung.
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Metadata
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Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1998. Includes bibliographical references.
Date issued
1998Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer SciencePublisher
Massachusetts Institute of Technology
Keywords
Electrical Engineering and Computer Science