dc.contributor.advisor | Roy Welsch and Dr. Daniel E. Whitney. | en_US |
dc.contributor.author | Gayer, Kenneth S., 1961- | en_US |
dc.date.accessioned | 2009-10-01T15:21:26Z | |
dc.date.available | 2009-10-01T15:21:26Z | |
dc.date.copyright | 1998 | en_US |
dc.date.issued | 1998 | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.1/47554 | |
dc.description | Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management; and, Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Chemical Engineering, 1998. | en_US |
dc.description | Includes bibliographical references (p. 135-136). | en_US |
dc.description.statementofresponsibility | by Kenneth S. Gayer. | en_US |
dc.format.extent | 154 p. | en_US |
dc.language.iso | eng | en_US |
dc.publisher | Massachusetts Institute of Technology | en_US |
dc.rights | M.I.T. theses are protected by
copyright. They may be viewed from this source for any purpose, but
reproduction or distribution in any format is prohibited without written
permission. See provided URL for inquiries about permission. | en_US |
dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | en_US |
dc.subject | Sloan School of Management | en_US |
dc.subject | Chemical Engineering | en_US |
dc.title | Hardware variability corrective action in Boeing 777 final assembly | en_US |
dc.type | Thesis | en_US |
dc.description.degree | M.S. | en_US |
dc.contributor.department | Sloan School of Management | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Chemical Engineering | |
dc.identifier.oclc | 40607062 | en_US |