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dc.contributor.advisorSteven B. Leeb.en_US
dc.contributor.authorAbler, Craig Bennett, 1975-en_US
dc.date.accessioned2009-10-01T15:32:34Z
dc.date.available2009-10-01T15:32:34Z
dc.date.copyright1998en_US
dc.date.issued1998en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/47690
dc.descriptionThesis (S.B. and M.Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1998.en_US
dc.descriptionIncludes bibliographical references (p. 133-134).en_US
dc.description.abstractA Nonintursive Load Monitor (NILM) is a device that determines the operating schedule of electric loads by properly locating and identifying transient events in the spectral envelopes of the current waveform measured at the utility service entry. The spectral envelopes of the current waveform are the coefficients of its time varying Fourier series representation and as such can be estimated by low-pass filtering the current mixed with appropriate basis sinusoids. Spectral envelope estimators have been termed pre-processors. In this thesis, two pre-processors were designed. The first utilizes magic sine waves as the basis functions instead of sinusoids. The second is a digital pre-processor developed on a digital signal processor. The digital design was used in complete NILM platforms and its performance is analyzed to determine the quality of the envelopes produced. Finally, avenues for further work on the digital pre-processing unit are suggested.en_US
dc.description.statementofresponsibilityby Craig Bennett Abler.en_US
dc.format.extent134 p.en_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectElectrical Engineering and Computer Scienceen_US
dc.titleSpectral envelope estimation for transient event detectionen_US
dc.typeThesisen_US
dc.description.degreeS.B.and M.Eng.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.identifier.oclc42256605en_US


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