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dc.contributorMcWhorter, Alan L. (Alan Louis), 1930-en_US
dc.contributorLincoln Laboratory.en_US
dc.date.accessioned2004-03-03T21:21:25Z
dc.date.available2004-03-03T21:21:25Z
dc.date.issued1955en_US
dc.identifier.otherno. 80 no. 295en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/4786
dc.descriptionIssued also as a Sc.D. thesis in the Dept. of Electrical Engineering, 1955.en_US
dc.descriptionBibliography: p. 110-112.en_US
dc.format.extentv, 122 p.en_US
dc.format.extent8692261 bytes
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherMIT Lincoln Laboratoryen_US
dc.relation.ispartofseriesTechnical report (Lincoln Laboratory) ; 80. Technical report (Massachusetts Institute of Technology. Research Laboratory of Electronics) ; 295.en_US
dc.subject.lccTK7855.M41 L741 no.80en_US
dc.subject.lcshSemiconductors Noiseen_US
dc.subject.lcshGermaniumen_US
dc.title1/f noise and related surface effects in germanium.en_US


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