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dc.contributorWaymouth, J. F. (John F.), 1926-en_US
dc.date.accessioned2004-03-03T21:50:23Z
dc.date.available2004-03-03T21:50:23Z
dc.date.issued1950en_US
dc.identifier.otherno. 159en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/4897
dc.description"July 20, 1950."en_US
dc.descriptionBibliography: p. 15.en_US
dc.description.sponsorshipArmy Signal Corps Contract No. W36-039-sc-32037 Project No. 102B Dept. of the Army Project No. 3-99-10-022en_US
dc.description.statementofresponsibilityJ.F. Waymouth, Jr.en_US
dc.format.extent14 p.en_US
dc.format.extent1090061 bytes
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherResearch Laboratory of Electronics, Massachusetts Institute of Technologyen_US
dc.relation.ispartofseriesTechnical report (Massachusetts Institute of Technology. Research Laboratory of Electronics) ; 159.en_US
dc.subject.lccTK7855.M41 R43 no.159en_US
dc.subject.lcshCathodesen_US
dc.titleDeterioration of oxide-coated cathodes under low duty-factor operationen_US


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