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    • Temperature Dependence of Digital Single-Event Transients in Bulk and Fully-Depleted SOI Technologies 

      Gouker, Pascale M.; Gadlage, Matthew J.; Ahlbin, Jonathan R.; Ramachandra, Vishwanath; Dinkin, Cody A.; e.a. (Institute of Electrical and Electronics Engineers, 2009-12)
      Factors that affect single-event transient pulse widths, such as drift, diffusion, and parasitic bipolar transistor parameters, are also strong functions of operating temperature. In this paper, SET pulse-width measurements ...