| dc.contributor.advisor | Donald R. Uhlmann. | en_US |
| dc.contributor.author | Tasker, G. William | en_US |
| dc.contributor.other | Massachusetts Institute of Technology. Dept. of Materials Science and Engineering. | en_US |
| dc.date.accessioned | 2009-11-06T16:04:15Z | |
| dc.date.available | 2009-11-06T16:04:15Z | |
| dc.date.copyright | 1987 | en_US |
| dc.date.issued | 1987 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/49574 | |
| dc.description | Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1987. | en_US |
| dc.description | MICROFICHE COPY AVAILABLE IN ARCHIVES AND SCIENCE. | en_US |
| dc.description | Vita. | en_US |
| dc.description | Includes bibliographies. | en_US |
| dc.description.statementofresponsibility | by G. William Tasker. | en_US |
| dc.format.extent | 241 leaves | en_US |
| dc.language.iso | eng | en_US |
| dc.publisher | Massachusetts Institute of Technology | en_US |
| dc.rights | M.I.T. theses are protected by
copyright. They may be viewed from this source for any purpose, but
reproduction or distribution in any format is prohibited without written
permission. See provided URL for inquiries about permission. | en_US |
| dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | en_US |
| dc.subject | Materials Science and Engineering. | en_US |
| dc.title | X-ray photoelectron spectroscopy of silicate glasses | en_US |
| dc.type | Thesis | en_US |
| dc.description.degree | Ph.D. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Materials Science and Engineering | |
| dc.identifier.oclc | 17349587 | en_US |
