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dc.contributor.advisorDonald R. Uhlmann.en_US
dc.contributor.authorTasker, G. Williamen_US
dc.contributor.otherMassachusetts Institute of Technology. Dept. of Materials Science and Engineering.en_US
dc.date.accessioned2009-11-06T16:04:15Z
dc.date.available2009-11-06T16:04:15Z
dc.date.copyright1987en_US
dc.date.issued1987en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/49574
dc.descriptionThesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1987.en_US
dc.descriptionMICROFICHE COPY AVAILABLE IN ARCHIVES AND SCIENCE.en_US
dc.descriptionVita.en_US
dc.descriptionIncludes bibliographies.en_US
dc.description.statementofresponsibilityby G. William Tasker.en_US
dc.format.extent241 leavesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectMaterials Science and Engineering.en_US
dc.titleX-ray photoelectron spectroscopy of silicate glassesen_US
dc.typeThesisen_US
dc.description.degreePh.D.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Dept. of Materials Science and Engineering.en_US
dc.identifier.oclc17349587en_US


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