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dc.contributor.authorCullington, E. H.en_US
dc.contributor.authorStrandberg, Malcom W. P.en_US
dc.contributor.authorTisza, Laszloen_US
dc.contributor.authorLawrance, R. B.en_US
dc.contributor.authorHill, Albert G.en_US
dc.contributor.authorKittel, C.en_US
dc.contributor.authorJulian, R. S.en_US
dc.contributor.authorNagle, D. E.en_US
dc.contributor.authorBrown, S. C.en_US
dc.contributor.authorGarrison, J. B.en_US
dc.contributor.authorKip, A. F.en_US
dc.contributor.authorSlater, J. C.en_US
dc.contributor.authorZabel, C. W.en_US
dc.contributor.authorIngersoll, J.en_US
dc.contributor.authorAllis, W. P.en_US
dc.contributor.authorHalpern, J.en_US
dc.contributor.authorFeld, B. T.en_US
dc.contributor.authorBeard, C. I.en_US
dc.contributor.authorKerr, Donald E.en_US
dc.contributor.authorLuttinger, J. M.en_US
dc.contributor.authorZacharias, J. R.en_US
dc.contributor.authorDailey, B. P.en_US
dc.contributor.authorHerlin, M. A.en_US
dc.contributor.authorMaxwell, E.en_US
dc.contributor.authorBiondi, M. A.en_US
dc.contributor.authorDavis, L., Jr.en_US
dc.date.accessioned2010-01-12T19:03:55Z
dc.date.available2010-01-12T19:03:55Z
dc.date.issued1946-10-15en_US
dc.identifierRLE_QPR_003_IIen_US
dc.identifier.urihttp://hdl.handle.net/1721.1/50647
dc.descriptionContains reports on two research projects.en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report October 15, 1946en_US
dc.relation.ispartofMicrowave Physicsen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 3en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherMicrowave Physicsen_US
dc.subject.otherRadio Frequency Spectroscopyen_US
dc.subject.otherLow Pressure Gas Dischargesen_US
dc.titleMicrowave Physicsen_US
dc.typeTechnical Reporten_US


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