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dc.contributor.authorHarvey, George G.en_US
dc.contributor.authorGoldey, J. M.en_US
dc.contributor.authorThomas, J. B.en_US
dc.date.accessioned2010-02-01T22:18:31Z
dc.date.available2010-02-01T22:18:31Z
dc.date.issued1954-01-15en_US
dc.identifierRLE_QPR_032_IIIen_US
dc.identifier.urihttp://hdl.handle.net/1721.1/51143
dc.descriptionContains reports on three research projects.en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, January 15, 1954en_US
dc.relation.ispartofSolid State Physicsen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 32en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherSolid State Physicsen_US
dc.subject.otherSoft X-ray Spectroscopyen_US
dc.subject.otherMicrowave Study of Semiconductorsen_US
dc.subject.otherEnergy Levels of Impurities in Silicon Carbideen_US
dc.titleSolid State Physicsen_US
dc.typeTechnical Reporten_US


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