| dc.contributor.author | Harvey, George G. | en_US |
| dc.contributor.author | Goldey, J. M. | en_US |
| dc.contributor.author | Thomas, J. B. | en_US |
| dc.date.accessioned | 2010-02-01T22:18:31Z | |
| dc.date.available | 2010-02-01T22:18:31Z | |
| dc.date.issued | 1954-01-15 | en_US |
| dc.identifier | RLE_QPR_032_III | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/51143 | |
| dc.description | Contains reports on three research projects. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) | en_US |
| dc.relation.ispartof | Massachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, January 15, 1954 | en_US |
| dc.relation.ispartof | Solid State Physics | en_US |
| dc.relation.ispartofseries | Massachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 32 | en_US |
| dc.rights | Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. | en_US |
| dc.subject.other | Solid State Physics | en_US |
| dc.subject.other | Soft X-ray Spectroscopy | en_US |
| dc.subject.other | Microwave Study of Semiconductors | en_US |
| dc.subject.other | Energy Levels of Impurities in Silicon Carbide | en_US |
| dc.title | Solid State Physics | en_US |
| dc.type | Technical Report | en_US |
