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Microwave Electronics

dc.contributor.authorBers, Abrahamen_US
dc.contributor.authorSchwab, W. C.en_US
dc.date.accessioned2010-02-02T00:42:46Z
dc.date.available2010-02-02T00:42:46Z
dc.date.issued1955-10-15en_US
dc.identifierRLE_QPR_039_Ven_US
dc.identifier.urihttp://hdl.handle.net/1721.1/51316
dc.descriptionContains reports on three research projects.en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMicrowave Electronicsen_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, October 15, 1955en_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 39en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherMicrowave Noise Measurements with a Radiometeren_US
dc.subject.otherMicrowave Electronicsen_US
dc.subject.otherKlystron Amplifier Noise Figureen_US
dc.subject.otherExperimental Determination of the Longitudinal Intrinsic Emission Noise Characteristics of an Electron Beam at Microwave Frequenciesen_US
dc.titleMicrowave Electronicsen_US
dc.typeTechnical Reporten_US


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