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Noise in Electron Devices

dc.contributor.authorHaus, Hermann A.en_US
dc.contributor.authorAdler, Richard B.en_US
dc.contributor.authorNelson, R. E.en_US
dc.date.accessioned2010-03-02T21:26:31Z
dc.date.available2010-03-02T21:26:31Z
dc.date.issued1956-04-15en_US
dc.identifierRLE_QPR_041_XIIen_US
dc.identifier.urihttp://hdl.handle.net/1721.1/51944
dc.descriptionContains reports on two research projects.en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, April 15, 1956en_US
dc.relation.ispartofNoise in Electron Devicesen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 41en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherNoise in Electron Devicesen_US
dc.subject.otherImproved Measure of Noise Performanceen_US
dc.subject.otherDiode Mixer Performance as a Function of Temperatureen_US
dc.titleNoise in Electron Devicesen_US
dc.typeTechnical Reporten_US


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