| dc.contributor.author | Higier, T. | en_US |
| dc.date.accessioned | 2010-03-03T18:44:40Z | |
| dc.date.available | 2010-03-03T18:44:40Z | |
| dc.date.issued | 1957-07-15 | en_US |
| dc.identifier | RLE_QPR_046_III | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/52072 | |
| dc.description | Contains reports on one research project. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) | en_US |
| dc.relation.ispartof | Massachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, July 15, 1957 | en_US |
| dc.relation.ispartof | Solid State Physics | en_US |
| dc.relation.ispartofseries | Massachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 46 | en_US |
| dc.rights | Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. | en_US |
| dc.subject.other | Solid State Physics | en_US |
| dc.subject.other | Breakdown of Single-Crystal Germanium with Zinc Impurities at T = 4°K by Microwave Electric Fields | en_US |
| dc.title | Solid State Physics | en_US |
| dc.type | Technical Report | en_US |
