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dc.contributor.advisorSamuel R. Madden and Swaminathan Ramany.en_US
dc.contributor.authorRamdass, Dennis Len_US
dc.contributor.otherMassachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2010-03-25T15:09:47Z
dc.date.available2010-03-25T15:09:47Z
dc.date.copyright2009en_US
dc.date.issued2009en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/53169
dc.descriptionThesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2009.en_US
dc.descriptionIncludes bibliographical references (leaves 55-56).en_US
dc.description.abstractSystems for diagnosing problems in highly complicated problem domains have been traditionally very difficult to design. Such problem diagnosis systems have often been restricted to the use of primarily rule-based methods for problem diagnosis in cases where machine learning for probabilistic methods has been made difficult by limited available training data. The probabilistic diagnostic methods that do not require a substantial amount of available training data usually require considerable expert involvement in design. This thesis proposes a model which balances the amount of expert involvement needed and the complexity of design in cases where training data for machine learning is limited. This model aims to use a variety of techniques and methods to translate, and augment, experts' quantitative knowledge of their problem diagnosis domain into quantitative parameters for a Bayesian network model which can be used to design effective and efficient problem diagnosis systems.en_US
dc.description.statementofresponsibilityby Dennis L. Ramdass.en_US
dc.format.extent56 leavesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectElectrical Engineering and Computer Science.en_US
dc.titleDesigning Bayesian networks for highly expert-involved problem diagnosis domainsen_US
dc.typeThesisen_US
dc.description.degreeM.Eng.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.identifier.oclc516352464en_US


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