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dc.contributor.authorIngraham, E. C.en_US
dc.date.accessioned2010-04-24T18:15:34Z
dc.date.available2010-04-24T18:15:34Z
dc.date.issued1963-04-15en_US
dc.identifierRLE_QPR_069_XVIIIen_US
dc.identifier.urihttp://hdl.handle.net/1721.1/53868
dc.descriptionContains a report on a research project.en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, April 15, 1963en_US
dc.relation.ispartofCommunication Sciences and Engineeringen_US
dc.relation.ispartofShop Notesen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 69en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherShop Notesen_US
dc.subject.otherMock Metric Is Fun and Useful Tooen_US
dc.titleShop Notesen_US
dc.typeTechnical Reporten_US


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