| dc.contributor.author | Ingraham, E. C. | en_US |
| dc.date.accessioned | 2010-04-24T18:15:34Z | |
| dc.date.available | 2010-04-24T18:15:34Z | |
| dc.date.issued | 1963-04-15 | en_US |
| dc.identifier | RLE_QPR_069_XVIII | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/53868 | |
| dc.description | Contains a report on a research project. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) | en_US |
| dc.relation.ispartof | Massachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, April 15, 1963 | en_US |
| dc.relation.ispartof | Communication Sciences and Engineering | en_US |
| dc.relation.ispartof | Shop Notes | en_US |
| dc.relation.ispartofseries | Massachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 69 | en_US |
| dc.rights | Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. | en_US |
| dc.subject.other | Shop Notes | en_US |
| dc.subject.other | Mock Metric Is Fun and Useful Too | en_US |
| dc.title | Shop Notes | en_US |
| dc.type | Technical Report | en_US |
