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Optical and Infrared Spectroscopy

dc.contributor.authorGeick, R.en_US
dc.date.accessioned2010-04-24T21:44:35Z
dc.date.available2010-04-24T21:44:35Z
dc.date.issued1965-10-15en_US
dc.identifierRLE_QPR_079_IVen_US
dc.identifier.urihttp://hdl.handle.net/1721.1/54137en_US
dc.descriptionContains report on one research project.en_US
dc.description.sponsorshipJoint Services Electronics Program (Contract DA36-039-AMC-03200(E))en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, October 15, 1965en_US
dc.relation.ispartofGeneral Physicsen_US
dc.relation.ispartofOptical and Infrared Spectroscopyen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 79en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherOptical Spectroscopyen_US
dc.subject.otherInfrared Spectroscopyen_US
dc.subject.otherTemperature Dependence of the Far Infrared Reflectivity of Magnesium Stannideen_US
dc.titleOptical and Infrared Spectroscopyen_US
dc.typeTechnical Reporten_US


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