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Noise in Electron Devices

dc.contributor.authorRafuse, R. P.en_US
dc.date.accessioned2010-06-07T21:32:43Z
dc.date.available2010-06-07T21:32:43Z
dc.date.issued1968-01-15en_US
dc.identifierRLE_QPR_088_XIVen_US
dc.identifier.urihttp://hdl.handle.net/1721.1/55691
dc.descriptionContains research objectives.en_US
dc.description.sponsorshipNational Aeronautics and Space Administration (Grant NRG-22-009-163)en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, January 15, 1968en_US
dc.relation.ispartofGeneral Physicsen_US
dc.relation.ispartofNoise in Electron Devicesen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 88en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherNoise in Electron Devicesen_US
dc.titleNoise in Electron Devicesen_US
dc.typeTechnical Reporten_US


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