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Optical and Infrared Spectroscopy

dc.contributor.authorParrish, J. F.en_US
dc.date.accessioned2010-06-08T19:07:14Z
dc.date.available2010-06-08T19:07:14Z
dc.date.issued1968-07-15en_US
dc.identifierRLE_QPR_090_VIen_US
dc.identifier.urihttp://hdl.handle.net/1721.1/55759
dc.descriptionContains reports on one research project.en_US
dc.description.sponsorshipJoint Services Electronics Programs (U. S. Army, U. S. Navy, and U. S. Air Force) under Contract DA 28-043-AMC-02536(E)en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, July 15, 1968en_US
dc.relation.ispartofGeneral Physicsen_US
dc.relation.ispartofOptical and Infrared Spectroscopyen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 90en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherOptical and Infrared Spectroscopyen_US
dc.subject.otherDielectric Response Functionen_US
dc.titleOptical and Infrared Spectroscopyen_US
dc.typeTechnical Reporten_US


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