dc.contributor.author | Diephuis, R. J. | en_US |
dc.contributor.author | Personick, S. D. | en_US |
dc.contributor.author | Halme, S. J. | en_US |
dc.contributor.author | Levitt, B. K. | en_US |
dc.contributor.author | Orr, R. S. | en_US |
dc.date.accessioned | 2010-06-09T18:18:01Z | |
dc.date.available | 2010-06-09T18:18:01Z | |
dc.date.issued | 1969-04-15 | en_US |
dc.identifier | RLE_QPR_093_VIII | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.1/55866 | |
dc.description | Contains reports on three research projects. | en_US |
dc.description.sponsorship | National Aeronautics and Space Administration (Grant NGL-22-009-013) | en_US |
dc.description.sponsorship | Joint Services Electronics Programs (U.S. Army, U.S. Navy, and U.S. Air Force) under Contract DA 28-043-AMC-02536(E) | en_US |
dc.language.iso | en | en_US |
dc.publisher | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) | en_US |
dc.relation.ispartof | Massachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, April 15, 1969 | en_US |
dc.relation.ispartof | Communication Sciences and Engineering | en_US |
dc.relation.ispartof | Processing and Transmission of Information | en_US |
dc.relation.ispartofseries | Massachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 93 | en_US |
dc.rights | Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. | en_US |
dc.subject.other | Processing of Information | en_US |
dc.subject.other | Transmission of Information | en_US |
dc.subject.other | Multiple Fault Detection in Combinational Logic Networks | en_US |
dc.subject.other | Optimal Mean-Square Estimation in Q-M Channels | en_US |
dc.subject.other | Bounds for Some Integral Expressions Involving Log-Normal Statistics | en_US |
dc.subject.other | Approximations for Some Integral Expressions Involving Log-Normal Statistics | en_US |
dc.title | Processing and Transmission of Information | en_US |
dc.type | Technical Report | en_US |