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dc.contributor.authorEden, Murrayen_US
dc.contributor.authorAllen, Jonathanen_US
dc.contributor.authorBlesser, Barry A.en_US
dc.contributor.authorHuang, T. S.en_US
dc.contributor.authorLee, Francis F.en_US
dc.contributor.authorMason, Samuel J.en_US
dc.contributor.authorOzonoff, David M.en_US
dc.contributor.authorSchreiber, William F.en_US
dc.contributor.authorTretiak, O. J.en_US
dc.contributor.authorTroxel, Donald E.en_US
dc.contributor.authorYoung, Ian T.en_US
dc.date.accessioned2010-07-14T21:40:50Z
dc.date.available2010-07-14T21:40:50Z
dc.date.issued1973-01-15en_US
dc.identifierRLE_QPR_108_XXIen_US
dc.identifier.urihttp://hdl.handle.net/1721.1/56371
dc.descriptionContains research objectives.en_US
dc.description.sponsorshipNational Institutes of Health (Grant 5 POI GM14940-06)en_US
dc.description.sponsorshipNational Institutes of Health (Grant 1 P01 GM19428-01)en_US
dc.description.sponsorshipNational Science Foundation (Grant GK-33736X)en_US
dc.description.sponsorshipJoint Services Electronics Programs (U. S. Army, U. S. Navy, and U. S. Air Force) under Contract DAAB07-71-C-0300en_US
dc.description.sponsorshipGrant from the Associated Pressen_US
dc.description.sponsorshipPeter Bent Brigham Hospital Purchase Orders F64088en_US
dc.description.sponsorshipPeter Bent Brigham Hospital Purchase Orders F65806en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, January 15, 1973en_US
dc.relation.ispartofCommunication Sciences and Engineeringen_US
dc.relation.ispartofCognitive Information Processingen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 108en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherCognitive Information Processingen_US
dc.titleCognitive Information Processingen_US
dc.typeTechnical Reporten_US


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