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dc.contributor.authorKing, J. G.en_US
dc.date.accessioned2010-07-14T22:25:36Z
dc.date.available2010-07-14T22:25:36Z
dc.date.issued1974-01-15en_US
dc.identifierRLE_QPR_112_IIen_US
dc.identifier.urihttp://hdl.handle.net/1721.1/56435
dc.descriptionContains research objectives and summary of research.en_US
dc.description.sponsorshipJoint Services Electronics Program (Contract DAAB07 -71 -C-0300)en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, January 15, 1974en_US
dc.relation.ispartofGeneral Physicsen_US
dc.relation.ispartofElectron Opticsen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 112en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherElectron Opticsen_US
dc.subject.otherModular Electron Optical Illumination Systemen_US
dc.subject.otherMultioptical Benchen_US
dc.subject.otherSpherical Aberration Corrector Module (SACM)en_US
dc.subject.otherAuger Emission Microscopeen_US
dc.titleElectron Opticsen_US
dc.typeTechnical Reporten_US


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