dc.contributor.author | King, J. G. | en_US |
dc.date.accessioned | 2010-07-14T22:25:36Z | |
dc.date.available | 2010-07-14T22:25:36Z | |
dc.date.issued | 1974-01-15 | en_US |
dc.identifier | RLE_QPR_112_II | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.1/56435 | |
dc.description | Contains research objectives and summary of research. | en_US |
dc.description.sponsorship | Joint Services Electronics Program (Contract DAAB07 -71 -C-0300) | en_US |
dc.language.iso | en | en_US |
dc.publisher | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) | en_US |
dc.relation.ispartof | Massachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, January 15, 1974 | en_US |
dc.relation.ispartof | General Physics | en_US |
dc.relation.ispartof | Electron Optics | en_US |
dc.relation.ispartofseries | Massachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 112 | en_US |
dc.rights | Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. | en_US |
dc.subject.other | Electron Optics | en_US |
dc.subject.other | Modular Electron Optical Illumination System | en_US |
dc.subject.other | Multioptical Bench | en_US |
dc.subject.other | Spherical Aberration Corrector Module (SACM) | en_US |
dc.subject.other | Auger Emission Microscope | en_US |
dc.title | Electron Optics | en_US |
dc.type | Technical Report | en_US |