dc.contributor.author | Graham, Michael R. | en_US |
dc.contributor.author | Coleman, John W. | en_US |
dc.date.accessioned | 2010-07-15T18:39:46Z | |
dc.date.available | 2010-07-15T18:39:46Z | |
dc.date.issued | 1976-01 | en_US |
dc.identifier | RLE_PR_117_II | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.1/56588 | |
dc.description | Contains research objectives and summary of research on one research project. | en_US |
dc.description.sponsorship | Joint Services Electronics Program (Contract DAAB07-75-C-1346) | en_US |
dc.language.iso | en | en_US |
dc.publisher | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) | en_US |
dc.relation.ispartof | Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1976 | en_US |
dc.relation.ispartof | General Physics | en_US |
dc.relation.ispartof | Electron Optics | en_US |
dc.relation.ispartofseries | Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 117 | en_US |
dc.rights | Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. | en_US |
dc.subject.other | Electron Optics | en_US |
dc.subject.other | High-Resolution High-Contrast Electron Optics | en_US |
dc.subject.other | Final Results with the First Prototype Auger Electron Microscope (AEM-1) | en_US |
dc.title | Electron Optics | en_US |
dc.type | Technical Report | en_US |