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dc.contributor.authorMontress, Gary K.en_US
dc.contributor.authorGupta, Madhu S.en_US
dc.contributor.authorKyhl, Robert L.en_US
dc.contributor.authorGlasser, Lance A.en_US
dc.contributor.authorBurke, Bernard F.en_US
dc.contributor.authorParrish, Alanen_US
dc.contributor.authorGiuffrida, Thomas S.en_US
dc.contributor.authorHaschick, Aubrey D.en_US
dc.date.accessioned2010-07-15T18:56:04Z
dc.date.available2010-07-15T18:56:04Z
dc.date.issued1976-07en_US
dc.identifierRLE_PR_118_VIIen_US
dc.identifier.urihttp://hdl.handle.net/1721.1/56621
dc.descriptionContains reports on three research projects.en_US
dc.description.sponsorshipJoint Services Electronics Program (Contract DAAB07-75-C-1346)en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, July 1976en_US
dc.relation.ispartofGeneral Physicsen_US
dc.relation.ispartofMicrowave and Millimeter Wave Techniquesen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 118en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherMicrowave and Millimeter Wave Techniquesen_US
dc.subject.otherFabrication and Characteristics of Microwave BARITT Diodesen_US
dc.subject.otherMicrowave Measurements on the Silicon Cryosaren_US
dc.subject.otherAtmospheric Refraction at Millimeter Wavelengthsen_US
dc.titleMicrowave and Millimeter Wave Techniquesen_US
dc.typeTechnical Reporten_US


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