Browsing RLE Progress Report, No. 131 (1988) by Subject "Focused Ion Beam Induced Depostion of Submicrometer Structures"

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    • Focused Ion Beam Fabrication 

      Melngailis, John; Lezec, Henri J.; Shepard, Mark I.; Musil, Christian R.; Murguia, James E.; e.a. (Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1988-01-01)