Now showing items 31-33 of 33

    • Table of Contents 

      Allen, Jonathan; Kleppner, Daniel (Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1987-01)
    • Ultralow-Temperature Measurements of Submicron Devices 

      Kastner, Marc A.; Field, S.; Licini, C.; Face, D.; Meirav, U.; e.a. (Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1987-01)
    • X-Ray Diffuse Scattering 

      Birgeneau, Robert J. (Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1987-01)