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dc.contributor.authorEzekiel, Shaoulen_US
dc.contributor.authorWu, Frederick Y-F.en_US
dc.contributor.authorHemmer, Philip R.en_US
dc.contributor.authorCole, James A.en_US
dc.contributor.authorBalsamo, Salvatore R.en_US
dc.contributor.authorWolosewicz, Jacken_US
dc.contributor.authorHackel, Richard P.en_US
dc.contributor.authorKare, Jordin T.en_US
dc.contributor.authorGoldstein, Stephan C.en_US
dc.contributor.authorDavis, James L.en_US
dc.contributor.authorFonstad, Clifton G., Jr.en_US
dc.contributor.authorHaus, Hermann A.en_US
dc.contributor.authorIppen, Erich P.en_US
dc.date.accessioned2010-07-15T20:44:00Z
dc.date.available2010-07-15T20:44:00Z
dc.date.issued1978-01en_US
dc.identifierRLE_PR_120_VIIIen_US
dc.identifier.urihttp://hdl.handle.net/1721.1/56707
dc.descriptionContains reports on three research projects.en_US
dc.description.sponsorshipNational Science Foundation (Grant PHY77-07156)en_US
dc.description.sponsorshipJoint Services Electronics Program (Contract DAABO7-76-C-1400)en_US
dc.description.sponsorshipU. S. Air Force - Office of Scientific Research (Grant AFOSR-76-3042)en_US
dc.description.sponsorshipU. S. Air Force - Office of Scientific Research (Contract F-44620-76-C-0079)en_US
dc.description.sponsorshipM.I.T. Sloan Fund for Basic Researchen_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1978en_US
dc.relation.ispartofGeneral Physicsen_US
dc.relation.ispartofQuantum Electronicsen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 120en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherQuantum Electronicsen_US
dc.subject.otherLaser Applicationsen_US
dc.subject.otherNonlinear Phenomenaen_US
dc.subject.otherDistributed Feedback Structuresen_US
dc.titleQuantum Electronicsen_US
dc.typeTechnical Reporten_US


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