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dc.contributor.authorHaus, Hermann A.en_US
dc.contributor.authorFonstad, Clifton G.en_US
dc.contributor.authorIppen, Erich P.en_US
dc.contributor.authorMelngailis, Johnen_US
dc.date.accessioned2010-07-15T21:38:10Z
dc.date.available2010-07-15T21:38:10Z
dc.date.issued1983-01en_US
dc.identifierRLE_PR_125_07en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/56868
dc.descriptionContains reports on nine research projects split into two sections.en_US
dc.description.sponsorshipNational Science Foundation (Grant DAR80-08752)en_US
dc.description.sponsorshipNational Science Foundation (Grant ECS79-19475)en_US
dc.description.sponsorshipJoint Services Electronics Program (Contract DAAG29-83-K-0003)en_US
dc.description.sponsorshipNational Science Foundation (Grant ECS80-20639)en_US
dc.description.sponsorshipNational Science Foundation (Grant ECS82-11650)en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1983en_US
dc.relation.ispartofOptics and Quantum Electronicsen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 125en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherOptics and Quantum Electronicsen_US
dc.subject.otherNonlinear Phenomenaen_US
dc.subject.otherPicosecond Optical Signal-Sampling Deviceen_US
dc.subject.otherDevices for High-Rate Optical Communicationsen_US
dc.subject.otherPicosecond Opticsen_US
dc.subject.otherUltrashort Pulse Formationen_US
dc.subject.otherFemtosecond Laser Systemen_US
dc.subject.otherParametric Scattering with Femtosecond Pulsesen_US
dc.subject.otherNear-IR Diagnosticsen_US
dc.subject.otherQuaternary (InGaAsP) Diagnosticsen_US
dc.subject.otherGrating Structuresen_US
dc.subject.otherSurface Acoustic Wave Gratingsen_US
dc.titleOptics and Quantum Electronicsen_US
dc.typeTechnical Reporten_US


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