dc.contributor.author | Berker, A. Nihat | en_US |
dc.contributor.author | Caflisch, Robert G. | en_US |
dc.contributor.author | McKay, Susan R. | en_US |
dc.contributor.author | Kaufman, Miron | en_US |
dc.contributor.author | Chase, Scott I. | en_US |
dc.contributor.author | Kardar, Mahran | en_US |
dc.contributor.author | Nightingale, M. Peter | en_US |
dc.contributor.author | Indekeu, Joseph Octave | en_US |
dc.date.accessioned | 2010-07-15T22:09:34Z | |
dc.date.available | 2010-07-15T22:09:34Z | |
dc.date.issued | 1986-01 | en_US |
dc.identifier | RLE_PR_128_08 | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.1/56965 | |
dc.description | Contains reports on six research projects. | en_US |
dc.description.sponsorship | Joint Services Electronics Program (Contract DAAG29-83-K-0003) | en_US |
dc.language.iso | en | en_US |
dc.publisher | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) | en_US |
dc.relation.ispartof | Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1986 | en_US |
dc.relation.ispartof | Phase Transitions in Chemisorbed Systems | en_US |
dc.relation.ispartofseries | Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 128 | en_US |
dc.rights | Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. | en_US |
dc.subject.other | Phase Transitions in Chemisorbed Systems | en_US |
dc.subject.other | Selenium Chemisorbed on the Nickel (100) Surface | en_US |
dc.subject.other | Modified Hyperscaling Relation for Phase Transitions under Random Fields | en_US |
dc.subject.other | Random-Field Critical Behavior | en_US |
dc.subject.other | Renormalization-Group Analysis of Heat-Capacity Critical Amplitudes | en_US |
dc.subject.other | N-Color Spin Systems in the Large N Limit | en_US |
dc.subject.other | Wetting near Critical Points | en_US |
dc.title | Phase Transitions in Chemisorbed Systems | en_US |
dc.type | Technical Report | en_US |