Ultralow-Temperature Measurements of Submicron Devices Nanometer-Scale Semiconductor Devices
Author(s)Kastner, Marc A.; Field, Stuart B.; Scott-Thomas, John H. F.; Meirav, Udi; Park, Samuel L.
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Contains project goals.
Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 130