Ultralow-Temperature Measurements of Submicron Devices Nanometer-Scale Semiconductor Devices

Author(s)
Kastner, Marc A.; Field, Stuart B.; Scott-Thomas, John H. F.; Meirav, Udi; Park, Samuel L.
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Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.
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Description
Contains project goals.
Date issued
1987-01-01
URI
http://hdl.handle.net/1721.1/57016
Publisher
Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
Other identifiers
RLE_PR_130_11
Series/Report no.
Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 130
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