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dc.contributor.authorAllen, Jonathanen_US
dc.contributor.authorArmstrong, Robert C.en_US
dc.contributor.authorBaltus, Donald G.en_US
dc.contributor.authorBamji, Cyrus S.en_US
dc.contributor.authorMcCormick, Lynne M.en_US
dc.contributor.authorMcCormick, Steven P.en_US
dc.contributor.authorMiyanaga, Hiroshien_US
dc.contributor.authorReichelt, Mark W.en_US
dc.contributor.authorVan Aelten, Filip J.en_US
dc.contributor.authorMusicus, Bruce R.en_US
dc.contributor.authorPrasanna, G. N. Srinivasaen_US
dc.contributor.authorSikes, Benneten_US
dc.contributor.authorSong, William S.en_US
dc.contributor.authorFogg, Dennis C. Y.en_US
dc.contributor.authorOlsen, James A.en_US
dc.contributor.authorPeterson, Kevinen_US
dc.contributor.authorFeder, Meiren_US
dc.contributor.authorWeinstein, Ehuden_US
dc.contributor.authorWyatt, John L., Jr.en_US
dc.contributor.authorHorn, Berthold K. P.en_US
dc.contributor.authorLee, Hae-Seungen_US
dc.contributor.authorPoggio, Tomasoen_US
dc.contributor.authorSodini, Charles G.en_US
dc.contributor.authorKeast, Craig L.en_US
dc.contributor.authorElfadel, Ibrahim M.en_US
dc.contributor.authorHakkarainen, Mikkoen_US
dc.contributor.authorStandley, David L.en_US
dc.contributor.authorMcQuirk, Ignacio S.en_US
dc.contributor.authorUmminger, Christopher B.en_US
dc.contributor.authorYoung, Woodwarden_US
dc.contributor.authorDevadas, Srinivasen_US
dc.contributor.authorWhite, Jacob K.en_US
dc.contributor.authorLumsdaine, Andrewen_US
dc.contributor.authorLloyd, Jennifer A.en_US
dc.contributor.authorAntoniadis, Dimitri A.en_US
dc.contributor.authorNabors, Keith S.en_US
dc.contributor.authorSilviera, Luis M.en_US
dc.contributor.authorTelichevsky, Ricardoen_US
dc.date.accessioned2010-07-16T04:00:28Z
dc.date.available2010-07-16T04:00:28Z
dc.date.issued1988-01-01 to 1988-12-31en_US
dc.identifierRLE_PR_131_03_01s_04en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/57061
dc.descriptionContains reports on twelve research projects.en_US
dc.description.sponsorshipAnalog Devices, Inc.en_US
dc.description.sponsorshipInternational Business Machines, Inc.en_US
dc.description.sponsorshipJoint Services Electronics Program (Contract DAAL03-86-K-0002)en_US
dc.description.sponsorshipJoint Services Electronics Program (Contract DAAL03-89-C-0001)en_US
dc.description.sponsorshipU.S. Air Force - Office of Scientific Research (Grant AFOSR 86-0164)en_US
dc.description.sponsorshipRockwell International Corporationen_US
dc.description.sponsorshipOKI Semiconductor, Inc.en_US
dc.description.sponsorshipU.S. Navy - Office of Naval Research (Contract N00014-81-K-0742)en_US
dc.description.sponsorshipCharles Stark Draper Laboratoryen_US
dc.description.sponsorshipNational Science Foundation (Grant MIP 84-07285)en_US
dc.description.sponsorshipNational Science Foundation (Grant MIP 87-14969)en_US
dc.description.sponsorshipBattelle Laboratoriesen_US
dc.description.sponsorshipNational Science Foundation (Grant MIP 88-14612)en_US
dc.description.sponsorshipDuPont Corporationen_US
dc.description.sponsorshipDefense Advanced Research Projects Agency/U.S. Navy - Office of Naval Research (Contract N00014-87-K-0825)en_US
dc.description.sponsorshipAmerican Telephone and Telegraphen_US
dc.description.sponsorshipDigital Equipment Corporationen_US
dc.description.sponsorshipNational Science Foundation (Grant MIP-88-58764)en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1988en_US
dc.relation.ispartofSystems and Signalsen_US
dc.relation.ispartofDigital Signal Processingen_US
dc.relation.ispartofCustom Integrated Circuitsen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 131en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherCustom Integrated Circuitsen_US
dc.subject.otherCellular Array for Image Processingen_US
dc.subject.otherAlgorithmic Fault Tolerance in Digital Signal Processingen_US
dc.subject.otherCompiling Signal Processing Algorithms into Architecturesen_US
dc.subject.otherIterative Algorithms for Stochastic Estimationen_US
dc.subject.otherThe Vision Chip Projecten_US
dc.subject.otherTechniques for Logic Synthesisen_US
dc.subject.otherTechniques for Testingen_US
dc.subject.otherTechniques for Design-for-Testabilityen_US
dc.subject.otherMixed Circuit/Device Simulationen_US
dc.subject.otherCircuit Simulation Algorithms for Specialized Applicationsen_US
dc.subject.otherNumerical Simulation of Short Channel MOS Devicesen_US
dc.subject.otherEfficient Capacitance Extraction Algorithmsen_US
dc.subject.otherParallel Numerical Simulation Algorithmsen_US
dc.titleCustom Integrated Circuitsen_US
dc.typeTechnical Reporten_US


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