Microstructural Evolution in Thin Films of Electronic Materials
Author(s)
Thompson, Carl V.; Frost, Harold J.; Floro, Jerrold A.; Liu, Yachin; Cho, Jaeshin; Kahn, Harold; Longworth, Hai P.; Smith, Henry I.; Palmer, Joyce E.; Burns, Geoffrey F.; Fonstad, Clifton G.; Clevenger, Lawrence A.; Ma, En; DeAvillez, Roberto R.; Tu, King-Ning; Evans, Paul; Im, James S.; Chen, Chenson K.; Jiran, Eva; Ro, Jaesang; Dubner, Andrew D.; Melngailis, John; Edell, David J.; ... Show more Show less
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Contains reports on ten research projects.
Date issued
1989-01-01Publisher
Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
Other identifiers
RLE_PR_132_01_01s_02
Series/Report no.
Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 132