dc.contributor.author | Birgeneau, Robert J. | en_US |
dc.contributor.author | Blum, Kenneth I. | en_US |
dc.contributor.author | Mak, Alan | en_US |
dc.contributor.author | Noh, Do-Young | en_US |
dc.contributor.author | Nuttall, William J. | en_US |
dc.contributor.author | Ramstad, Monte J. | en_US |
dc.contributor.author | Salvucci, Elizabeth M. | en_US |
dc.date.accessioned | 2010-07-16T04:16:36Z | |
dc.date.available | 2010-07-16T04:16:36Z | |
dc.date.issued | 1990-01-01 to 1990-12-31 | en_US |
dc.identifier | RLE_PR_133_01_03s_02 | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.1/57130 | |
dc.description | Contains an introduction, reports on three research projects and a list of publications. | en_US |
dc.description.sponsorship | Joint Services Electronics Program DAAL03-89-C-0001 | en_US |
dc.language.iso | en | en_US |
dc.publisher | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) | en_US |
dc.relation.ispartof | Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1990 | en_US |
dc.relation.ispartof | Solid State Physics, Electronics and Optics | en_US |
dc.relation.ispartof | Surfaces and Interfaces | en_US |
dc.relation.ispartof | Synchrotron X-Ray Studies of Surface Disordering | en_US |
dc.relation.ispartofseries | Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 133 | en_US |
dc.rights | Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. | en_US |
dc.subject.other | Synchrotron X-Ray Studies of Surface Disordering | en_US |
dc.subject.other | Metal Surface Studies | en_US |
dc.subject.other | Semiconductor Surface Studies | en_US |
dc.subject.other | Stepped Si(111) Surfaces | en_US |
dc.subject.other | Publications | en_US |
dc.title | Synchrotron X-Ray Studies of Surface Disordering | en_US |
dc.type | Technical Report | en_US |