Show simple item record

dc.contributor.authorBirgeneau, Robert J.en_US
dc.contributor.authorBlum, Kenneth I.en_US
dc.contributor.authorMak, Alanen_US
dc.contributor.authorNoh, Do-Youngen_US
dc.contributor.authorNuttall, William J.en_US
dc.contributor.authorRamstad, Monte J.en_US
dc.contributor.authorSalvucci, Elizabeth M.en_US
dc.date.accessioned2010-07-16T04:16:36Z
dc.date.available2010-07-16T04:16:36Z
dc.date.issued1990-01-01 to 1990-12-31en_US
dc.identifierRLE_PR_133_01_03s_02en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/57130
dc.descriptionContains an introduction, reports on three research projects and a list of publications.en_US
dc.description.sponsorshipJoint Services Electronics Program DAAL03-89-C-0001en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1990en_US
dc.relation.ispartofSolid State Physics, Electronics and Opticsen_US
dc.relation.ispartofSurfaces and Interfacesen_US
dc.relation.ispartofSynchrotron X-Ray Studies of Surface Disorderingen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 133en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherSynchrotron X-Ray Studies of Surface Disorderingen_US
dc.subject.otherMetal Surface Studiesen_US
dc.subject.otherSemiconductor Surface Studiesen_US
dc.subject.otherStepped Si(111) Surfacesen_US
dc.subject.otherPublicationsen_US
dc.titleSynchrotron X-Ray Studies of Surface Disorderingen_US
dc.typeTechnical Reporten_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record