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Custom Integrated Circuits

dc.contributor.authorAllen, Jonathanen_US
dc.contributor.authorWyatt, John L., Jr.en_US
dc.contributor.authorDevadas, Srinivasen_US
dc.contributor.authorWhite, Jacob K.en_US
dc.contributor.authorArmstrong, Robert C.en_US
dc.contributor.authorBaltus, Donald G.en_US
dc.contributor.authorBamji, Cyrus S.en_US
dc.contributor.authorReichelt, Mark W.en_US
dc.contributor.authorVan Aelten, Filip J.en_US
dc.contributor.authorHorn, Berthold K. P.en_US
dc.contributor.authorLee, Hae-Seungen_US
dc.contributor.authorPoggio, Tomasoen_US
dc.contributor.authorSodini, Charles G.en_US
dc.contributor.authorDecker, Steven J.en_US
dc.contributor.authorElfadel, Ibrahim M.en_US
dc.contributor.authorHakkarainen, Juha M.en_US
dc.contributor.authorKeast, Craig L.en_US
dc.contributor.authorMcQuirk, Ignacio S.en_US
dc.contributor.authorSeidel, Mark N.en_US
dc.contributor.authorStandley, David L.en_US
dc.contributor.authorUmminger, Christopher B.en_US
dc.contributor.authorYang, Woodwarden_US
dc.contributor.authorYu, Paul C.en_US
dc.contributor.authorKukula, James H.en_US
dc.contributor.authorChen, Curtis S.en_US
dc.contributor.authorFrants, Marinaen_US
dc.contributor.authorLam, Kevinen_US
dc.contributor.authorShen, Amelia H.en_US
dc.contributor.authorLeeb, Steven B.en_US
dc.contributor.authorSilveira, Luis M.en_US
dc.contributor.authorLumsdaine, Andrewen_US
dc.contributor.authorLloyd, Jennifer A.en_US
dc.contributor.authorPhillips, Joel R.en_US
dc.contributor.authorRahmat, Khaliden_US
dc.contributor.authorAntoniadis, Dimitri A.en_US
dc.contributor.authorNabors, Keith S.en_US
dc.contributor.authorKim, Songminen_US
dc.contributor.authorTelichevesky, Ricardoen_US
dc.date.accessioned2010-07-16T04:18:37Z
dc.date.available2010-07-16T04:18:37Z
dc.date.issued1990-01-01 to 1990-12-31en_US
dc.identifierRLE_PR_133_03_01s_06en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/57139
dc.descriptionContains reports on ten research projects.en_US
dc.description.sponsorshipAnalog Devices, Inc.en_US
dc.description.sponsorshipIBM Corporationen_US
dc.description.sponsorshipNational Science Foundation/Defense Advanced Research Projects Agency Grant MIP 88-14612en_US
dc.description.sponsorshipAnalog Devices Career Development Assistant Professorshipen_US
dc.description.sponsorshipU.S. Navy - Office of Naval Research Contract N0014-87-K-0825en_US
dc.description.sponsorshipAT&Ten_US
dc.description.sponsorshipDigital Equipment Corporationen_US
dc.description.sponsorshipNational Science Foundation Grant MIP 88-58764en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1990en_US
dc.relation.ispartofSystems and Signalsen_US
dc.relation.ispartofDigital Signal Processingen_US
dc.relation.ispartofCustom Integrated Circuitsen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 133en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherCustom Integrated Circuitsen_US
dc.subject.otherThe MIT Vision Chip Projecten_US
dc.subject.otherAnalog VLSI Systems for Fast Image Acquisitionen_US
dc.subject.otherAnalog VLSI Systems for Early Vision Processingen_US
dc.subject.otherTechniques for Logic Synthesisen_US
dc.subject.otherTechniques for Logic Verificationen_US
dc.subject.otherTechniques for Logic Testingen_US
dc.subject.otherMixed Circuit/Device Simulationen_US
dc.subject.otherSimulation Algorithms for Clocked Analog Circuitsen_US
dc.subject.otherParallel Simulation Algorithms for Analog Array Signal Processorsen_US
dc.subject.otherNumerical Simulation of Short Channel MOS Devicesen_US
dc.subject.otherEfficient 3-D Capacitance Extraction Algorithmsen_US
dc.subject.otherParallel Numerical Algorithmsen_US
dc.subject.otherIntegrated Circuit Reliabilityen_US
dc.titleCustom Integrated Circuitsen_US
dc.typeTechnical Reporten_US


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