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dc.contributor.authorBirgeneau, Robert J.en_US
dc.contributor.authorBlum, Kenneth I.en_US
dc.contributor.authorNoh, Do-Youngen_US
dc.contributor.authorNuttall, William J.en_US
dc.contributor.authorRamstad, Monte J.en_US
dc.contributor.authorSalvucci, Elizabeth M.en_US
dc.date.accessioned2010-07-16T04:31:50Z
dc.date.available2010-07-16T04:31:50Z
dc.date.issued1991-01-01 to 1991-12-31en_US
dc.identifierRLE_PR_134_01_04s_02en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/57194
dc.descriptionContains introduction, reports on two research projects and a list of publications.en_US
dc.description.sponsorshipJoint Services Electronics Program Contract DAAL03-89-C-0001en_US
dc.description.sponsorshipJoint Services Electronics Program Contract DAAL03-92-C-0001en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1991en_US
dc.relation.ispartofSolid State Physics, Electronics and Opticsen_US
dc.relation.ispartofSurfaces and Interfacesen_US
dc.relation.ispartofSynchrotron X-Ray Studies of Surface Disorderingen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 134en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherSynchrotron X-Ray Studies of Surface Disorderingen_US
dc.subject.otherMetal Surface Studiesen_US
dc.subject.otherSemiconductor Surface Studiesen_US
dc.titleSynchrotron X-Ray Studies of Surface Disorderingen_US
dc.typeTechnical Reporten_US


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