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dc.contributor.authorJoannopoulos, John D.en_US
dc.contributor.authorDal Pino, Arnaldoen_US
dc.contributor.authorMeade, Robert D.en_US
dc.contributor.authorArias, Tomas A.en_US
dc.contributor.authorCho, Kyeongjaeen_US
dc.contributor.authorRappe, Andrew M.en_US
dc.contributor.authorWang, Jingen_US
dc.contributor.authorAriel, Imadielen_US
dc.date.accessioned2010-07-16T05:11:55Z
dc.date.available2010-07-16T05:11:55Z
dc.date.issued1992-01-01 to 1992-12-31en_US
dc.identifierRLE_PR_135_01_04s_04en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/57208
dc.descriptionContains an introduction, reports on two research projects and a list of publications.en_US
dc.description.sponsorshipJoint Services Electronics Program Contract DAALO3-92-C-0001en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1992en_US
dc.relation.ispartofSolid State Physics, Electronics and Opticsen_US
dc.relation.ispartofSurfaces and Interfacesen_US
dc.relation.ispartofSemiconductor Surface Studiesen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 135en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherSemiconductor Surface Studiesen_US
dc.subject.otherSurface Reconstructionen_US
dc.subject.otherComputation at Large Length Scalesen_US
dc.titleSemiconductor Surface Studiesen_US
dc.typeTechnical Reporten_US


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