| dc.contributor.author | Joannopoulos, John D. | en_US |
| dc.contributor.author | Arias, Tomas A. | en_US |
| dc.contributor.author | Meade, Robert D. | en_US |
| dc.contributor.author | Capaz, Rodrigo B. | en_US |
| dc.contributor.author | Cho, Kyeongjae | en_US |
| dc.contributor.author | Wang, Jing | en_US |
| dc.contributor.author | Ariel, Imadiel | en_US |
| dc.date.accessioned | 2010-07-16T19:24:33Z | |
| dc.date.available | 2010-07-16T19:24:33Z | |
| dc.date.issued | 1993-01-01 to 1993-12-31 | en_US |
| dc.identifier | RLE_PR_136_01_04s_04 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/57259 | |
| dc.description | Contains an introduction, reports on two research projects and a list of publications. | en_US |
| dc.description.sponsorship | Joint Services Electronics Program Contract DAAL03-92-C-0001 | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) | en_US |
| dc.relation.ispartof | Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1993 | en_US |
| dc.relation.ispartof | Solid State Physics, Electronics and Optics | en_US |
| dc.relation.ispartof | Surfaces and Interfaces | en_US |
| dc.relation.ispartof | Semiconductor Surface Studies | en_US |
| dc.relation.ispartofseries | Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 136 | en_US |
| dc.rights | Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. | en_US |
| dc.subject.other | Semiconductor Surface Studies | en_US |
| dc.subject.other | Defects on Surfaces | en_US |
| dc.subject.other | Cross-sectional Scanning Tunneling Microscopy | en_US |
| dc.title | Semiconductor Surface Studies | en_US |
| dc.type | Technical Report | en_US |
