| dc.contributor.author | Ashoori, Raymond C. | en_US |
| dc.contributor.author | Chan, Ho-Bun | en_US |
| dc.contributor.author | Berman, David B. | en_US |
| dc.contributor.author | Brodsky, Mikhail G. | en_US |
| dc.contributor.author | Heemeyer, Sven | en_US |
| dc.contributor.author | Folch, Albert | en_US |
| dc.date.accessioned | 2010-07-16T20:35:46Z | |
| dc.date.available | 2010-07-16T20:35:46Z | |
| dc.date.issued | 1994-01-01 to 1994-12-31 | en_US |
| dc.identifier | RLE_PR_137_01_02s_06 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/57302 | |
| dc.description | Contains research goals and objectives, reports on four research projects and a list of publications. | en_US |
| dc.description.sponsorship | Joint Services Electronics Program Contract DAAL03-92-C-0001 | en_US |
| dc.description.sponsorship | Joint Services Electronics Program Grant DAAH04-95-1-0038 | en_US |
| dc.description.sponsorship | National Science Foundation Young Investigator Award | en_US |
| dc.description.sponsorship | Packard Foundation | en_US |
| dc.description.sponsorship | U.S. Navy - Office of Naval Research | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) | en_US |
| dc.relation.ispartof | Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1994 | en_US |
| dc.relation.ispartof | Solid State Physics, Electronics and Optics | en_US |
| dc.relation.ispartof | Quantum-Effect Devices | en_US |
| dc.relation.ispartof | Single-Electron Spectroscopy | en_US |
| dc.relation.ispartofseries | Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 137 | en_US |
| dc.rights | Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. | en_US |
| dc.subject.other | Single-Electron Spectroscopy | en_US |
| dc.subject.other | Traps Created by Disorder in Semiconductor Structures | en_US |
| dc.subject.other | Traps Created by Impurities in Semiconductor Structures | en_US |
| dc.subject.other | Artificial Atoms | en_US |
| dc.subject.other | Spatially Resolved Charge Sensing | en_US |
| dc.subject.other | Single-Electron Transistors for Spectroscopy | en_US |
| dc.title | Single-Electron Spectroscopy | en_US |
| dc.type | Technical Report | en_US |
