dc.contributor.author | Joannopoulos, John D. | en_US |
dc.contributor.author | Cho, Kyeongjae | en_US |
dc.contributor.author | Mirbt, Susanne | en_US |
dc.contributor.author | Villeneuve, Pierre R. | en_US |
dc.contributor.author | Fan, Shanhui | en_US |
dc.contributor.author | Mekis, Attila | en_US |
dc.contributor.author | Park, Ickjin | en_US |
dc.contributor.author | Wang, Tairan | en_US |
dc.contributor.author | O'Meara, Margaret E. | en_US |
dc.date.accessioned | 2010-07-17T01:36:14Z | |
dc.date.available | 2010-07-17T01:36:14Z | |
dc.date.issued | 1997-01-01 to 1997-12-31 | en_US |
dc.identifier | RLE_PR_140_01_04s_02 | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.1/57394 | |
dc.description | Contains an introduction, reports on two research projects and a list of publications. | en_US |
dc.description.sponsorship | Joint Services Electronics Program Grant DAAH04-95-1-0038 | en_US |
dc.language.iso | en | en_US |
dc.publisher | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) | en_US |
dc.relation.ispartof | Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1997 | en_US |
dc.relation.ispartof | Solid State Physics, Electronics and Optics | en_US |
dc.relation.ispartof | Surfaces and Interfaces | en_US |
dc.relation.ispartof | Semiconductor Surface Studies | en_US |
dc.relation.ispartofseries | Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 140 | en_US |
dc.rights | Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. | en_US |
dc.subject.other | Semiconductor Surface Studies | en_US |
dc.subject.other | Adatom Vacancies on the Si( 111)-(7x7) Surface | en_US |
dc.subject.other | Unified Approach for Calculation of Force-Constants of Atomic Coordinates | en_US |
dc.subject.other | Unified Approach for Calculation of Accelerated Convergence of Atomic Coordinates | en_US |
dc.title | Semiconductor Surface Studies | en_US |
dc.type | Technical Report | en_US |