Broad-band soft X-ray polarimetry

Author(s)
Schulz, Norbert S.; Murphy, Kendrah Dawn; Marshall, Herman; Heilmann, Ralf K
Thumbnail
DownloadMarshall-2010-Broadband soft x-ray polarimetry.pdf (330.6Kb)
PUBLISHER_POLICY
Terms of use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Metadata
Show full item record
Abstract
We developed an instrument design capable of measuring linear X-ray polarization over a broad-band using conventional spectroscopic optics, using a method previously described by Marshall (2008) involving laterally graded, multilayer-coated flat mirrors. We present possible science investigations with such an instrument and two possible configurations. This instrument could be used in a small orbiting mission or scaled up for the International X-ray Observatory. Laboratory work has begun that would demonstrate the capabilities of key components.
Date issued
2010-07
URI
http://hdl.handle.net/1721.1/61637
Department
MIT Kavli Institute for Astrophysics and Space Research
Journal
Proceedings of SPIE--the International Society for Optical Engineering
Publisher
SPIE
Citation
Herman L. Marshall, Ralf K. Heilmann, Norbert S. Schulz and Kendrah D. Murphy, "Broadband soft x-ray polarimetry", Proc. SPIE 7732, 77320F (2010); doi:10.1117/12.857443 © 2010 SPIE
Version: Final published version
ISSN
0277-786X
Collections